Founded by a team of highly experienced people, with more than 20 year combined experience in instrument protection, we are dedicated to help you use your instruments at their highest potential and let you focus on your research and analysis.
Lab Protect is specialized in the protection of laboratory instruments from environmental disturbances.
We are dedicated to providing you with the best products and services possible.
Whether you are acquiring a new instrument and want to protect it, having issues on current installations or anticipating future investments, we are able to analyze your environment and advise you the most suitable solution for your requirements.
Thanks to a large portfolio of products, with complimentary and carefully selected technologies from dozen suppliers, we will be able to provide you a tailored solution that solves your problems and match exactly your needs.
Microscopy applications (electron microscopy, optical microscopy and scanning probe microscopy) are our largest domain of expertise.
When it comes to protect a sensitive instrument from environment, most of the laboratories don’t know exactly how to protect exactly their instrument, choose the right solution or be surrounded by the right partners.
If the external disturbances are not well isolated, it can be difficult achieve the highest performance of a sensitive instrument, get accurate or repetitive measurements, which can be frustrating for such high investment. As a consequence, scientists can lose lot of time, energy and productivity identifying or solving these problems, which can impact their research, development or quality control.
Choosing Lab Protect, it’s choosing the right experienced partner that is able to solve any of your problems with a transparent and customer orientated policy
Summary of the main products we provide.
Protection of microscopes and metrology equipment. Several size, working surface and technologies available. We adapt it to your environment, application and budget.
Protection of electron microscopes (SEM, TEM) and scanning tunneling microscopes (STM). Active piezo solutions with high efficiency at low frequencies.
Protection of electron microscopes (SEM, TEM) and focused ion beam. Local isolation of the column or customized design adapted to your room and requirements. Guaranteed results to reach specifications.
Isolation of magnetic field sources (power station, cable trays…) with adapted alloys. Protection of electron microscopes. Customized design and guarantees to reach specifications.
Protection of atomic force microscopes (AFM) from acoustic noise. Standard and customized enclosures available for an instrument or for a noise source (water chiller, vacuum pumps…).